制冷制热产品介绍
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- 制冷制热产品介绍
- 半导体内存模组测试仪
- 128段内存温度测试检验设备
128段内存温度测试检验设备
内存条-60℃ ◀▶ 125℃温度测试仪（专利）)
该设备能够对存储器半导体的多个通道进行温度测试。 它通常以 128 Para 和 256 Para 的形式提供。 它保证 2 年的耐用性，并且在现场运行 3 年无事故。 运行此设备需要冷却水，CDA 的实用程序。
与其他设备相比的改进
| Improvement items | Details | commercial SYSTEM in Market | Futrotech Co., Ltd. | Remarks |
|---|---|---|---|---|
| Test time shorten (minute) | 1 Cycle Time | 14.4 (minute) | 8.11 (minute) |
+25 ℃ ▶ 105 ℃ 105 ℃ ▶ 85 ℃ +85℃ ▶ -25 ℃ -25℃ ▶ -40 ℃ -40 ℃ ▶ 25 ℃ |
| Minimum temperature improvement | low temperature max implementation temperature | -40℃ | -55℃ | -15 ℃ improvement |
| Improvement of power consumption | power consumption | 24.2 | 14.75 | Kwh |
| 24 hours a day operation | 581 | 354 | power cost 100 won/Kwh applied | |
| 1 month operation | 17,424 | 10,620 | ||
| 1 year uptime | 209,088 | 127,440 | ||
| 1 year electricity cost | 20,908,800 | 12,744,000 | annual electricity cost 8.16 million won savings. |
Room 104, 107, Myeongdeok-ro, Nam-gu, Daegu (Daemyeong-dong, Keimyung University Uiyanggwan)
CEO : Jae DonggukBusiness registration number : 716-86-01767
TEL : 053-654-4567FAX : 053-654-4568E-mail : thermoelectric01@gmail.com